Thế thế hệ thiết bị tán xạ tia X dạng beamline tiếp theo trong phòng thí nghiệm
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Tính linh hoạt tối đa
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Hiệu suất cao nhất
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Nhiều không gian cho môi trường mẫu
Xeuss 3.0 là thế hệ mới nhất trong dòng Xeuss đã được kiểm chứng và đã được lắp đặt tại các cơ sở nghiên cứu hàng đầu trên thế giới. Nó kết hợp tất cả những cải tiến mới nhất từ Xenocs để tăng thêm tính năng, tính linh hoạt và dễ sử dụng.
“It’s a piece of equipment that’s as easy to use as a coffee maker. And it’s a very low-risk way to visualize materials to see if it tells you something new.”
Professor Eric Cochran – Director of the Center for Bioplastics and Biocomposites (CB2), based at Iowa State University
Get big picture on your sample:
- Truy cập thông tin cấu trúc vật liệu từ Ångströms đến milimét với mô đun InXight
- Kích thước & phân bố kích thước hạt ( ISO 17876:2020)
- Nồng độ hạt (ISO/CD 23484)
- Diện tích bề mặt riêng của vật liệu xốp, kích thước và phân bố lỗ rỗng (ISO 20804)
- Hình thái học
- Cấu trúc bên trong (lõi/vỏ)
- Tương tác giữa các hạt
- Khối lượng phân tử
- Cấu trúc tinh thể (semi crystal, liquid crystal,…) hoặc vô định hình
- Độ xốp, trật tự và định hướng
- Mật độ điện tử, cấu trúc tinh thể và định hướng của màng mỏng
- ….
Ưu điểm:
- Có thể phân tích nhiều mẫu: rắn, lỏng, bột, nhão, gel, đục, sẫm màu,…
- Đa dạng vật liệu: vật chất mềm “soft matter”, hạt nano, sinh học (DNA, RNA, protein, liposome, lipid, enzyme, từ peptide đến virus); polyme, colloid, gel, màng mỏng, sợi,…
- Chuẩn bị mẫu đơn giản với lượng mẫu lớn mà không phá hủy mẫu
- Thiết kế SMART cung cấp khả năng phân tích trực tiếp từ mẫu tới kết quả
- Kết quả chính xác với dải đo động cao
- Kết quả mang ý nghĩa thống kê cao, giàu thông tin quan trọng bổ sung cho nhiều kỹ thuật khác như SEM, TEM, AFM, NMR, XRD, DLS, Raman,…
- Dễ dàng thực hiện thí nghiệm (In situ hay in operando) khi thay đổi nhiệt độ, áp suất, pH, độ ẩm, ứng suất,…
Nichole M. Wonderling – Materials Characterization Laboratory, The Pennsylvania State University –
“The Xeuss 2.0 was selected for a variety of reasons. The first, and perhaps one of the most important reasons, was the uncomparable amount of effort that XENOCS put into demonstrating the capability of the instrument and the scientists behind the instrument. The process began more than one year prior to purchase with XENOCS measuring a number of samples and then presenting the results to our faculty and students. The time dedicated to both obtaining the highest quality results possible and to presenting those results was unprecedented. We were impressed from this point forward.
The reason for this is that our laboratory is looking for more than the typical vendor-customer relationship. We want to be a partner with our vendor and based on the depth of interaction provided during the evaluation process, we were convinced that XENOCS is able and willing to provide that deeper relationship. We look forward to continuing and developing that relationship once the instrument is on site.
A second reason is generation of high accuracy data in absolute intensity measurement in an automated fashion. Our previous system required a processing routine for every sample to convert the data to absolute intensity values which consumed valuable analyst time. Additionally, the promised high resolution mapping capability (down to less than 200 microns) will offer substantial benefit to our researchers that are working in the area of plastic engineering and production. Finally, competitive pricing was highly significant.
All of these features, when combined, make the Xeuss 2.0 the logical choice for our laboratory. We anxiously await its’ arrival so that we can begin a new chapter of SAXS measurements at The Pennsylvania State University.”
Dr. Cristián Huck Iriart – Laboratory of Applied Crystallography, National University of San Martín, Argentina –
“With the Xeuss flexibility in the experimental setup, it is possible to imagine or design in situ experiments or sample environments. This is a remarkable aspect in addition to the quality of excellence in Xenocs products”
“We chose the Xeuss 2.0 SAXS/WAXS equipment from Xenocs because it has a very flexible configuration. An experiment is more than just make a measure of a sample. It is the possibility to adapt resourcefully your capabilities – or to create ones – in order to answer a question. We have experience in synchrotrons and big facilities and are used to designing our own sample environments for experiments. With the Xeuss flexibility in the experimental setup, it is possible to imagine or design in situ experiments or sample environments. This is a remarkable aspect in addition to the quality of excellence in Xenocs products.”
Dr. José Leobardo Bañuelos – Department of Physics, The University of Texas at El Paso –
“The Xeuss 2.0 HR is built with components currently in use in several world-class leading synchrotron research facilities, including the hybrid scatterless slits and Dectris detector technology. The x-ray source provides excellent flux on sample and has very little maintenance.
The Xeuss is a very open platform that allows integration of a variety of sample environments. The user has control over each component of the instrument, which makes it possible to explore new instrument configurations and experimental approaches. Because the instrument is modular, this allows us to upgrade it with new features in the future.”
“Xenocs’ close collaboration with synchrotron facilities in the software development side means we can expect regular updates to the software, resulting in a post-experiment data reduction and analysis user experience similar to the one at synchrotrons.”
Nicolae Viorel Pavel –
“Having a Xeuss in our lab has made it possible to answer research questions with quickly accessible experiments, without having to wait for the availability of less handy facilities. This can speed up some steps of the research quite a lot.”
The Xenocs support has always been very helpful in general and promptly intervened to solve problems. I would say that the support service has been fundamental for us. I have the impression that a process of improvement of software and hardware is going on at Xenocs also collecting feedback from customers. We will likely continue to benefit from software upgrades and hopefully be able to enrich our sample environments collection in the future.
Dr. Oleksandr Mykhaylyk – Department of Chemistry, University of Sheffield, UK –
” We always wanted to have a facility of this kind which would enable us to perform most of our measurements here in Sheffield with an access 24/7/365. “
“We are currently at the stage of learning and testing the instrument and at the moment we have seven users representing different laboratories from Chemistry, Physics and Materials Engineering.
Having more than 15 years experience in SAXS with both synchrotron and laboratory experiments we always wanted to have a facility of this kind which would enable us to perform most of our measurements here in Sheffield with an access 24/7/365. A combination of MetalJet X-ray source, new 3D X-ray mirrors, scatterless slits and Pilatus 1M detector put us in a position where we can easily run SAXS measurements with resolution 0.001 Å-1 in the SMALL lab.
Moreover, a design of the instrument provides us with the opportunity to run most of X-ray scattering experiments including SAXS/WAXS/GiSAXS/GiWAXS/X-ray reflectometry.
Our users from Physics were very excited about their first GiWAXS measurements performed here in Sheffield and not at synchrotron.”
Vladimir-Lucian Ene – Department of Science and Engineering of Oxide Materials and Nanomaterials Faculty of Applied Chemistry and Materials Science, University POLITEHNICA of Bucharest, Romania –
Being the first and sole manufacturer worldwide (up to date) of our needed setup was the main reason we choose to acquire the Xeuss 2.0 UHR from Xenocs. Keeping researchers up to date with all the breakthroughs concerning Xeuss and the technique itself is clearly a challenge that Xenocs aims to accomplish. By providing updates on firmware/software and online webinars, Xenocs proves that it is connected to the community the product succeeds to attract.
For all the reasons mentioned above, adding the innovative technologies used (scatterless slits, very accurate detectors [®Dectris Pilatus 300K]) and the great technical support provided, working with the professionals at Xenocs on and regarding the Xeuss machine has proven a wise choice.”
We have acquired the Xeuss equipment mainly for the determination of the micro- and nanoscale changes of structure in biological samples as well as polymers, composites and particles. Among others, parameters such as average particle size, shape, distribution, and surface-to-volume ratio are and will be determined in a series of materials. For ordered systems such as lamellae or proteins, a wide variety of polymer structure changes can now be answered. In addition, features such as GISAXS and LINKAM stages provide solutions for both, the study of order in thin films and also the identifying of real-time temperature-dependent states of structure.
Dr. Youli Li – Materials Research Laboratory University of California at Santa Barbara –
“I have found the team at Xenocs not only technically superbly competent but also scientifically very experienced. And in the small angle scattering field it is a very important aspect because you need expert advice both in research as well as in technical instrumentation in order to make the best use of saxs instruments.”
Prof. Dimitri Ivanov – Institute of Materials Science, Mulhouse, CNRS, France –
“What I like in the Xenocs equipment is that it has a modular design. It allows to combine different techniques and also importantly you can combine small & wide angles x-ray scattering. And for example for both the scattering range you can vary the resolution of the machine to adapt it to the need of the samples you are studying.”