The Ultimate Solution for Nanoscale Characterization using SAXS/WAXS/GISAXS/USAXS/Imaging

The Xeuss Pro instrument for nanoscale characterization is the ultimate laboratory SAXS/WAXS/GISAXS/USAXS/Imaging beamline, embodying over a decade of advanced research in Small-Angle X-ray Scattering technology. The Xeuss Pro integrates state-of-the-art advancements to set new standards in X-ray scattering instrumentation.

Designed to offer remarkable versatility and precision, this laboratory SAXS/WAXS/GISAXS/USAXS/Imaging beamline brings atomic- to nano-scale characterization for scientific research to industrial applications alike, directly in your lab.

Key features that set the Xeuss Pro apart

• Ultimate data quality: Achieve superior results with state-of-the-art optics, Clean Beam technology and high-resolution, low-noise detection capabilities.
• Maximum modular versatility: Customize your setup with modular options to adapt to any experiment and effectively address your scientific questions.
• Unlimited experimental possibilities: Experience unparalleled flexibility with our large sample chamber and a variety of sample holders and environments.
• Comprehensive software suite: Enhance your research workflow with an all-encompassing software suite for seamless data acquisition, processing, and analysis.