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        Home / PRODUCTS / PROFESSIONAL ANALYTICAL EQUIPMENT / Nanomaterials analysis and research equipment: X-Ray Diffraction (XRD), Small Angle X-ray Scattering (SAXS) / Wide Angle X-ray Scattering (WAXS) Instruments
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        Nano-inXider
        Nano-inXider - Image 2
        Nano-inXider - Image 3
        Nano-inXider - Image 4

        Nano-inXider

        Model: Nano-inXider

        Brand: Xenocs

        Origin: France

        Nano-inXider is a compact, intelligent SAXS/WAXS instrument for efficient, accurate and easy nanoscale characterization.

        Categories: Xenocs - France, APPLICATIONS, AUTOMATED CHEMISTRY ANALYZER, COSMETICS, EQUIPMENT FOR ANALYSIS CHEMICAL AND PHYSICAL PROPERTIES OF PHARMACEUTICAL PRODUCTS, FOOD & BEVERAGE, LIFE SCIENCE, LIFE SCIENCE EQUIPMENT, MATERIALS SCIENCE, Measuring equipment for liquid samples, MEDICINES, Nanomaterials analysis and research equipment: X-Ray Diffraction (XRD), Small Angle X-ray Scattering (SAXS) / Wide Angle X-ray Scattering (WAXS) Instruments, OIL & GAS, PHARMACEUTICAL, PROFESSIONAL ANALYTICAL EQUIPMENT, Small angle X-ray Scattering Instrument Tags: Nano inXider, SAXS, Xenocs
        • Description
        • Reviews (0)

        Smart nanoscale characterization

        Understanding nanostructures has never been easier. The Nano-inXider is a cutting-edge SAXS/WAXS (Small and Wide-Angle X-ray Scattering) instrument designed for efficiency, accuracy, and ease of use. Whether analyzing nanoparticles, polymers, biomaterials, or thin films, it delivers high-quality results quickly and reliably. With an automated workflow and a compact design, the Nano-inXider makes nanoscale characterization accessible for any lab.

        Nano-inXider
        Nano-inXider

         Key benefits and features
        • Directly from Samples to Results: Fast, consistent, and reliable measurements with minimal effort are ensured by the SMART design of the Nano-inXider through automatic alignment, acquisition, and data processing.
        • Accurate and High Dynamic Range Measurements: The instrument features beamstop-less data acquisition and Clean Beam Technology, ensuring high signal-to-noise ratios even for weakly scattering samples.
        • Simultaneous Data from Atomic- to Nano-Scale: Analyze structural features across multiple length scales in a single measurement. No need for separate SAXS and WAXS measurements—the dual-detector system captures information from atomic-scale structures to larger nanostructures in a single exposure.
        • Low Cost of Ownership: The Nano-inXider is designed for daily use with minimal maintenance. Its compact vertical footprint saves lab space, while its low power consumption and long-lasting components reduce operational costs, providing a high return on investment for both research and industrial applications.
        More information on the Xenocs website

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