The Next Generation beamline for the laboratory
- Maximum flexibility
- Ultimate performance
- Plenty of space for sample environment
Accelerates your research
The Xeuss 3.0 enables the nanostructure characterization of soft matter and nanomaterials. It allows users to explore a wide range of applications.
With the Xeuss 3.0 you can perform Small- and Wide-Angle X-ray Scattering (SAXS/WAXS) measurements in transmission or in Grazing Incidence (GI-SAXS/WAXS) as well as Ultra-SAXS measurements to provide comprehensive nano- and micro -structural information on all types of samples. And with InXight X-ray Imaging module, you can get bigger picture on your sample from the crystalline structure to the macrostructure and watch operando dynamics over all length scales in your lab when you need it.
The Xeuss 3.0 is used for many applications.
Typical measurements with the Xeuss 3.0 include:
1. Particle size distribution ranging from a few nanometers to more than 350 nm in diameter (or up to few microns with USAXS)
2. Crystallization rates and lamellar structure of semicrystalline polymers
3. Size and shape analysis of surfactants or proteins and other macromolecules in solutions
4. Organization and orientation of nanomaterials at the atomic- or the nano-scale, in bulk or at surfaces
5. Phase segregation studies of alloys
6. Operando and in situ studies
=>The Xeuss 3.0 is the perfect tool to make your lab a multi-user research center platform and initiate new collaborations.
See more on www.xenocs.com
Reviews
There are no reviews yet.