Introduction
The JSX-1000S X-ray fluorescence spectrometer (XRF) is a benchtop elemental analyzer that delivers convenience and high performance. With simple touch screen operation, this instrument allows for rapid qualitative and quantitative analysis. It is an ideal solution for various applications, from RoHS screening to industrial quality control.
Product Overview
The JSX-1000S is designed to simplify the XRF analysis workflow. Users simply place the sample and touch the screen to start analysis. The instrument utilizes JEOL’s own Silicon Drift Detector (SDD) and a newly developed optical system to achieve high sensitivity and high throughput. It supports both FP (Fundamental Parameter) and calibration curve methods, along with specialized screening functions. An optional sample chamber vacuum unit enhances sensitivity for light elements.
Key Features
- Simple Operation: Intuitive touch screen interface with “Set & Touch” operation.
- High Sensitivity: Uses an SDD detector and filters optimized for the entire energy range.
- Smart Analysis: Smart FP method provides accurate quantitative results without standard samples.
- Solution Applications: Pre-recorded recipes automate analysis for specific fields.
- Versatility: Optional vacuum chamber for better light element analysis.
- Sample Variety: Analyzes solids, liquids, and powders with auto sample changer options.
Technical Specifications
| Model | JSX-1000S |
| Element Range | Mg to U (F to U optional) |
| X-ray Generator | 5 to 50 kV, 1 mA, Rh target |
| Detector | Silicon Drift Detector (SDD) |
| Chamber Size | 300mm (D) × 80mm (H) |
| Chamber Atmosphere | Air / Vacuum (Option) |
| Operation PC | Windows® Desktop PC with touch panel |
Applications
- RoHS compliance screening (Cd, Pb, Cr, Br, Hg).
- Analysis of metals and alloys.
- Thin film thickness and coating measurement.
- Impurity analysis in food and materials.
- Liquid analysis (with Low Vacuum Capsule).
- Quality control in industrial manufacturing.
Pricing
Please contact us for consultation and detailed quotation.
FAQ
1. What is the JSX-1000S X-ray fluorescence spectrometer used for?
It is used to determine the elemental composition of various sample types (solid, liquid, powder) quickly and non-destructively.
2. What is the Smart FP method?
Smart FP is a fundamental parameter calculation method that enables accurate quantification without complex calibration curves, automatically correcting for thickness and residual balance.
3. Can the instrument analyze light elements?
Yes, it can analyze from Magnesium (Mg) to Uranium (U). With the vacuum chamber option, detection of light elements like Fluorine (F) is significantly improved.
4. Is the instrument difficult to operate?
It is very simple. The interface is designed like a tablet; you just set the sample and touch the screen to get results.
5. Does it support liquid sample analysis?
Yes, it can analyze liquid samples. JEOL also offers a unique “Low Vacuum Capsule” for analyzing light elements in liquids without Helium gas.
Conclusion
The JSX-1000S X-ray fluorescence spectrometer (XRF) is a powerful analytical tool that combines simplicity with high performance. Its versatile analysis capabilities and smart features make it a top choice for quality control laboratories.
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